Product Overview
The LT-25x25-MicroTestTargetsV1 is a 1-inch (25×25 mm) multi-pattern micro calibration target manufactured using high-precision laser writing on chrome-on-glass substrate. Designed for microscope users, R&D optical engineers, and machine vision system integrators, it consolidates four specialized calibration functions into a single compact target — eliminating the need to swap between multiple test charts during optical alignment and validation workflows.
The target is divided into four functional quadrants:
Q1 — USAF 1951 Resolution Target (Groups 2–9, Element 1)
The industry-standard bar chart for spatial resolution measurement. Allows quick visual and quantitative evaluation of resolving power across a wide magnification range. Suitable for comparing objective lenses and detecting focus or aberration issues.
Q2 — Dot Matrix Array: Ø20 µm, 100 µm Grid (40×40)
A large-format dot matrix for geometric distortion mapping and field uniformity testing. The regular 100 µm pitch provides a reliable reference grid for software-based distortion correction.
Q3 — Multi-Feature Quadrant: Positive/Negative Dots, Siemens Star (5°, 1 µm tip), Serial Number Structure
The Siemens star enables radial MTF measurement and focus sensitivity testing down to 1 µm feature size. Positive and negative dot patterns help assess contrast transfer and polarity response. The serial number structure provides traceability for calibration records.
Q4 — Dot Matrix Array: Ø10 µm, 50 µm Grid (40×40) + 5×5 Siemens Star Matrix (0.4 mm grid) + 2×2 mm Full Chrome Square
The fine 50 µm dot grid supports high-magnification distortion analysis. The Siemens star matrix allows field-position-dependent MTF mapping across the image plane. The 2×2 mm chrome square serves as a reference for intensity uniformity and dark-level calibration.
A precision linear scale runs along the center axis of the target in both X and Y directions, providing direct measurement reference within the field of view.
Who Is This For?
This target is ideal for:
Microscope objective lens qualification — evaluate resolving power and MTF at the working magnification
Industrial machine vision system calibration — correct geometric distortion and field uniformity before deployment
Camera & lens R&D labs — validate optical performance against traceable micro-scale references
Quality control & metrology — use as a traceable reference artifact in optical measurement workflows